深圳六碳科技和北京大學(xué)化學(xué)與分子工程學(xué)院鄭俊榮教授合作的用二次諧波表征二維單層薄膜晶疇的文章發(fā)表在Optics Letters上。
Second-harmonic generation divergence—a method for domain size evaluation of 2D materials。
https://www.osapublishing.org/ol/abstract.cfm?uri=ol-46-1-33
Abstract：Single-atomic-layered materials are important for future electronics. They allow optoelectronic devices to be fabricated at the single-atomic layer level. A single-atomic-layered two-dimensional (2D) transition metal dichalcogenide (TMD) film is usually composed of randomly orientated single-crystalline domains, and the size distribution of the domains on a large-area film has a significant impact on the applications of the film, but the impact is difficult to characterize. We report an approach to evaluate the size of the single-crystalline domains by measuring the second-harmonic generation divergence caused by the domains of different orientations. Using this method, domain size mapping on an
8×8
mm2 8×8mm2 region of a continuous MoS2 film is achieved. This method provides a fast and efficient way of domain size characterization across a large area in a non-destructive and transfer-free manner for single-atomic-layered TMD films.
